Surface profilometry based on polarization analysis.

Surface profilometry based on polarization analysis. Research Abstract Details 

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Surface profilometry based on polarization analysis. Abstract Text:

J P Lesso,A J Duncan,W Sibbett,M J Padgett,

We report a novel algorithm for the analysis of interferometric images for surface profiling. The algorithm can be used with any interferometric system in which the two interfering beams are orthogonally polarized. The algorithm is based on a measurement of the polarization state and gives a unique value for the path difference that is not subject to the ambiguities associated with fringe counting or phase unwrapping. A detector array allows the polarization state and hence the height of every pixel in the image to be determined simultaneously. The concept is easily extended to enable one to obtain the profiles of moving surfaces from a single pulse of illumination.

Surface profilometry based on polarization analysis. Publishing Authors By Initials

JP Lesso,AJ Duncan,W Sibbett,MJ Padgett,

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Surface profilometry based on polarization analysis. Journal Published:

PUBLICATION TYPE: Journal Article

Journal: Optics letters

VOLUME: 23

Page Numbers: 1800-2

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ISSN: 0146-9592

DAY: 1

MONTH: Dec

YEAR: 1998

Surface profilometry based on polarization analysis. Information

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LANGUAGE: eng

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Country: United States

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MEDLINETA: Opt Lett

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