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Reflection from surfaces with a thin overlayer.

Reflection from surfaces with a thin overlayer. Research Abstract Details 

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  • Reflection from surfaces with a thin overlayer. Abstract Text:

    r m fechtchenkoR M Fechtchenko,a v vinogradovA V Vinogradov,

    An approach to treating experimental reflectometry and ellipsometry data for bulk samples covered by an overlayer is suggested. This approach can be used for measurement of optical constants of solids, characterization of overlayers, and probing the abruptness of the spatial distribution of a bulk dielectric function. Numerical simulation shows that in the soft-x-ray and extreme-UV ranges the method can be applied for overlayers up to 3-8 nm thick.

    Reflection from surfaces with a thin overlayer. Publishing Authors By Initials

    rm fechtchenkoRM Fechtchenko,av vinogradovAV Vinogradov,

    For similar abstracts research abstracts see: abstracts research

    PUBMED ID PMID:

    MEDLINE DATE:

    Reflection from surfaces with a thin overlayer. Journal Published:

    PUBLICATION TYPE: Journal Article

    Journal: Optics letters

    VOLUME: 25

    Page Numbers: 998-1000

    Journal Abbreviation:

    ISSN: 0146-9592

    DAY: 15

    MONTH: Jul

    YEAR: 2000

    Reflection from surfaces with a thin overlayer. Information

    Number of References:

    LANGUAGE: eng

    NlmUniqueID: 7708433

    Reflection from surfaces with a thin overlayer. Keywords Mesh Terms:

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    Chemical & Substance for Abstract: Reflection from surfaces with a thin overlayer. Information

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    Grant and Affiliation Information for Reflection from surfaces with a thin overlayer.

    AFFILIATION:

    Country: United States

    United States Research PublicationUnited States Research Publication

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    MEDLINETA: Opt Lett

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