Taking advantage of the high brilliance of synchrotron radiation, a system was developed for rapid mapping of the orientation distribution of crystal grains (texture) in polycrystalline materials using an imaging plate. A monochromatized beam is incident on the sample, which is rotated using the omega-axis mechanism of an X-ray diffractometer so that the surface of the sphere of poles of the selected reflection is scanned by the Ewald sphere. Simultaneously, the imaging plate is translated vertically with a velocity that is synchronized with that of the sample rotation. It is possible to record pole figures over an extended angular range within a short period of time, typically of the order of minutes. The method has been applied to the observation of a time change in the orientation distribution of metal sheets at elevated temperatures.
Rapid mapping of texture in polycrystalline materials using an imaging plate on a synchrotron radiation source. Publishing Authors By Initials
Rapid mapping of texture in polycrystalline materials using an imaging plate on a synchrotron radiation source. Journal Published:
PUBLICATION TYPE: Journal Article
Journal: Journal of synchrotron radiation
VOLUME: 2
Page Numbers: 49-55
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ISSN: 0909-0495
DAY: 1
MONTH: Jan
YEAR: 1995
Rapid mapping of texture in polycrystalline materials using an imaging plate on a synchrotron radiation source. Information
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LANGUAGE: eng
NlmUniqueID: 9888878
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Country: Denmark
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MEDLINETA: J Synchrotron Radiat
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