Quantitative atomic resolution scanning transmission electron microscopy.

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Quantitative atomic resolution scanning transmission electron microscopy. Abstract Text:

Complete understanding of atomic resolution high-angle annular dark-field (Z-contrast) images requires quantitative agreement between simulations and experiments. We show that intensity variations can be placed on an absolute scale by normalizing the measured image intensities to the incident beam. We construct fractional intensity images of a SrTiO3 single crystal for regions of different thickness up to 120 nm. Experimental images are compared directly with image simulations. Provided that spatial incoherence is taken into account in the simulations, almost perfect agreement is found between simulation and experiment.

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Quantitative atomic resolution scanning transmission electron microscopy. Journal Published:

PUBLICATION TYPE: Journal Article

Journal: Physical review letters

VOLUME: 100

Page Numbers: 206101

Journal Abbreviation: Phys. Rev. Lett.

ISSN: 0031-9007

DAY: 23

MONTH: 05

YEAR: 2008

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LANGUAGE: eng

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Grant and Affiliation Information for Quantitative atomic resolution scanning transmission electron microscopy.

AFFILIATION: Materials Department, University of California, Santa Barbara, California 93106-5050, USA.

Country: United States

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MEDLINETA: Phys Rev Lett

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