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Multichannel Mueller matrix ellipsometer for real-time spectroscopy of anisotropic surfaces and films.

Multichannel Mueller matrix ellipsometer for real-time spectroscopy of anisotropic surfaces and films. Research Abstract Details 

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  • Multichannel Mueller matrix ellipsometer for real-time spectroscopy of anisotropic surfaces and films. Abstract Text:

    j leeJ Lee,j kohJ Koh,r w collinsR W Collins,

    A multichannel ellipsometer in the dual-rotating-compensator configuration has been developed for potential applications in real-time Mueller matrix spectroscopy of anisotropic surfaces and films. This instrument provides spectra (1.7-5.3 eV) in all 16 elements of the unnormalized Mueller matrix M of a film-substrate system with a minimum overall data acquisition time of t(a) = 0.25 s. We have applied this instrument first for high-precision determination of spectra in M with t(a) = 2.5 s for a microscopically sculptured film.

    Multichannel Mueller matrix ellipsometer for real-time spectroscopy of anisotropic surfaces and films. Publishing Authors By Initials

    j leeJ Lee,j kohJ Koh,rw collinsRW Collins,

    For similar abstracts research abstracts see: abstracts research

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    Multichannel Mueller matrix ellipsometer for real-time spectroscopy of anisotropic surfaces and films. Journal Published:

    PUBLICATION TYPE: Journal Article

    Journal: Optics letters

    VOLUME: 25

    Page Numbers: 1573-5

    Journal Abbreviation:

    ISSN: 0146-9592

    DAY: 1

    MONTH: Nov

    YEAR: 2000

    Multichannel Mueller matrix ellipsometer for real-time spectroscopy of anisotropic surfaces and films. Information

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    LANGUAGE: eng

    NlmUniqueID: 7708433

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    Country: United States

    United States Research PublicationUnited States Research Publication

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    MEDLINETA: Opt Lett

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