Molecular characterization of durum and common wheat recombinant lines carrying leaf rust resistance (Lr19) and yellow pigment (Y) genes from Lophopyrum ponticum.

Molecular characterization of durum and common wheat recombinant lines carrying leaf rust resistance (Lr19) and yellow pigment (Y) genes from Lophopyrum ponticum. Research Abstract Details 

Research Abstract Table of Contents

Jump to the:

Molecular characterization of durum and common wheat recombinant lines carrying leaf rust resistance (Lr19) and yellow pigment (Y) genes from Lophopyrum ponticum. Abstract Text:

Wenjun Zhang,Adam J Lukaszewski,Jim Kolmer,Marcelo A Soria,Sham Goyal,Jorge Dubcovsky,

Chromosome 7E from Lophopyrum ponticum carries a valuable leaf rust resistant gene designated Lr19. This gene has not been widely used in common wheat breeding because of linkage with the yellow pigment gene Y. This gene tints flour yellow, reducing its appeal in bread making. However, a high level of yellow pigment is desirable in durum wheat breeding. We produced 97 recombinant chromosomes between L. ponticum transfer 7D.7E#1 and its wheat homoeologues, using the ph1b mutation that promotes homoeologous pairing. We characterized a subset of 37 of these lines with 11 molecular markers and evaluated their resistance to leaf rust and the abundance of yellow pigment. The Lr19 gene was mapped between loci Xwg420 and Xmwg2062, whereas Y was mapped distal to Xpsr687, the most distal marker on the long arm of chromosome 7. A short terminal 7EL segment translocated to 7A, including Lr19 and Y (line 1-23), has been transferred to durum wheat by backcrossing. The presence of this alien segment significantly increased the abundance of yellow pigment. The Lr19 also conferred resistance to a new durum leaf rust race from California and Mexico that is virulent on most durum wheat cultivars. The new durum lines with the recombinant 7E segment will be useful parents to increase yellow pigment and leaf rust resistance in durum wheat breeding programs. For the common wheat breeding programs, we selected the recombinant line 1-96, which has an interstitial 7E segment carrying Lr19 but not Y. This recombinant line can be used to improve leaf rust resistance without affecting flour color. The 7EL/7DL 1-96 recombinant chromosome did not show the meiotic self-elimination previously reported for a 7EL/7BL translocation.

Molecular characterization of durum and common wheat recombinant lines carrying leaf rust resistance (Lr19) and yellow pigment (Y) genes from Lophopyrum ponticum. Publishing Authors By Initials

W Zhang,AJ Lukaszewski,J Kolmer,MA Soria,S Goyal,J Dubcovsky,

For similar plants: plant families and groups: angiosperms: poaceae: triticum research abstracts see: plants: plant families and groups: angiosperms: poaceae: triticum research

PUBMED ID PMID:

MEDLINE DATE:

Molecular characterization of durum and common wheat recombinant lines carrying leaf rust resistance (Lr19) and yellow pigment (Y) genes from Lophopyrum ponticum. Journal Published:

PUBLICATION TYPE: Research Support, U.S. Gov't,

Journal: TAG. Theoretical and applied genetics. Theoretisch

VOLUME: 111

Page Numbers: 573-82

Journal Abbreviation: Theor. Appl. Genet.

ISSN: 0040-5752

DAY: 24

MONTH: 05

YEAR: 2005

Molecular characterization of durum and common wheat recombinant lines carrying leaf rust resistance (Lr19) and yellow pigment (Y) genes from Lophopyrum ponticum. Information

Number of References:

LANGUAGE: eng

NlmUniqueID: 145600

Molecular characterization of durum and common wheat recombinant lines carrying leaf rust resistance (Lr19) and yellow pigment (Y) genes from Lophopyrum ponticum. Keywords Mesh Terms:

KEYWORDS: Triticum

MESH TERMS: microbiology

Chemical & Substance for Abstract: Molecular characterization of durum and common wheat recombinant lines carrying leaf rust resistance (Lr19) and yellow pigment (Y) genes from Lophopyrum ponticum. Information

Substance Name: Pigments, Biological

Registry Number: 0

Grant and Affiliation Information for Molecular characterization of durum and common wheat recombinant lines carrying leaf rust resistance (Lr19) and yellow pigment (Y) genes from Lophopyrum ponticum.

AFFILIATION: Department of Plant Sciences, University of California Davis, One Shields Avenue, Davis, CA 95616, USA.

Country: Germany

AGENCY:

GRANT:

ACRONYM:

MEDLINETA: Theor Appl Genet

REFSOURCE:

DATABASENAME:

ACCESSION NUMBER:

Number Hits: 0

Molecular characterization of durum and common wheat recombinant lines carrying leaf rust resistance Lr19 and yellow pigment Y genes from Lophopyrum ponticum Related Publications

• A microcolinearity study at the earliness per se gene Eps-A(m)1 region reveals an ancient duplication that preceded the wheat-rice divergence.
• Allelic variation at the VRN-1 promoter region in polyploid wheat.
• Association between allelic variation at the Phytoene synthase 1 gene and yellow pigment content in the wheat grain.
• Construction and characterization of a half million clone BAC library of durum wheat ( Triticum turgidum ssp. durum).
• High-temperature adult-plant (HTAP) stripe rust resistance gene Yr36 from Triticum turgidum ssp. dicoccoides is closely linked to the grain protein content locus Gpc-B1.
• Identification of candidate CBF genes for the frost tolerance locus Fr-Am2 in Triticum monococcum.
• Molecular characterization of durum and common wheat recombinant lines carrying leaf rust resistance (Lr19) and yellow pigment (Y) genes from Lophopyrum ponticum.
• Precise mapping of a locus affecting grain protein content in durum wheat.
• RNA interference for wheat functional gene analysis.
• The chromosome region including the earliness per se locus Eps-Am1 affects the duration of early developmental phases and spikelet number in diploid wheat.
• Wheat FT protein regulates VRN1 transcription through interactions with FDL2.