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Ion beam capture and charge breeding in electron cyclotron resonance ion source plasmas.

Ion beam capture and charge breeding in electron cyclotron resonance ion source plasmas. Research Abstract Details 

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  • Ion beam capture and charge breeding in electron cyclotron resonance ion source plasmas. Abstract Text:

    jin-soo kimJin-Soo Kim,l zhaoL Zhao,b p cluggishB P Cluggish,richard pardoRichard Pardo,jin-soo kimJin-Soo Kim,l zhaoL Zhao,b p cluggishB P Cluggish,richard pardoRichard Pardo,jin-soo kimJin-Soo Kim,l zhaoL Zhao,b p cluggishB P Cluggish,richard pardoRichard Pardo,

    Beam capture of injected ions and charge breeding in electron cyclotron resonance (ECR) charge breeder ion source plasmas has been investigated utilizing an ECR plasma modeling code, the generalized ECR ion source model, and a Monte Carlo beam capture code. Beam capturing dynamics, charge breeding in the plasma, and the extracted charged ion states are described. Optimization of ion beam energy is performed for (1) high beam capture efficiency and (2) high charge state ion beam extractions. A sample case study for ANL-ECR has been performed. Ions entering ECR ion source plasma are slowed down mostly by the background ions. Assuming Maxwellian plasma ions, maximum beam energy loss occurs when the beam velocity is around the background thermal velocity in magnitude. It is also found that beam capture location affects charge state distribution. For instance, with a majority of beam ions captured near the middle of the device higher currents for higher charge states are obtained. The beam ions captured near the entry have a higher probability of backstreaming after they are captured. For this reason, the optimum beam energy of the injected Ar(+) beam ions for charge breeding is generally higher than the optimum input beam energy for maximum beam energy loss.

    Ion beam capture and charge breeding in electron cyclotron resonance ion source plasmas. Publishing Authors By Initials

    js kimJS Kim,l zhaoL Zhao,bp cluggishBP Cluggish,r pardoR Pardo,js kimJS Kim,l zhaoL Zhao,bp cluggishBP Cluggish,r pardoR Pardo,js kimJS Kim,l zhaoL Zhao,bp cluggishBP Cluggish,r pardoR Pardo,

    For similar abstracts research abstracts see: abstracts research

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    Ion beam capture and charge breeding in electron cyclotron resonance ion source plasmas. Journal Published:

    PUBLICATION TYPE: Journal Article

    Journal: The Review of scientific instruments

    VOLUME: 78

    Page Numbers: 103503

    Journal Abbreviation:

    ISSN: 0034-6748

    DAY: 5

    MONTH: Oct

    YEAR: 2007

    Ion beam capture and charge breeding in electron cyclotron resonance ion source plasmas. Information

    Number of References:

    LANGUAGE: eng

    NlmUniqueID: 405571

    Ion beam capture and charge breeding in electron cyclotron resonance ion source plasmas. Keywords Mesh Terms:

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    Grant and Affiliation Information for Ion beam capture and charge breeding in electron cyclotron resonance ion source plasmas.

    AFFILIATION: FAR-TECH, Inc., San Diego, California 92121, USA.

    Country: United States

    United States Research PublicationUnited States Research Publication

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    MEDLINETA: Rev Sci Instrum

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