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Imaging flaws in soldered joints of integrated circuits using an ultrasound electronic scanning technique.

Imaging flaws in soldered joints of integrated circuits using an ultrasound electronic scanning technique. Research Abstract Details 

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  • Imaging flaws in soldered joints of integrated circuits using an ultrasound electronic scanning technique. Abstract Text:

    j kubotaJ Kubota,y mushaY Musha,m takahashiM Takahashi,

    An electronic scanning c-scopic 25-MHz ultrasonic imaging system has been developed for high-speed precise testing of electronic parts such as ICs. Two-dimensional scanning is performed, one axis being electronic and the other mechanical. A focused beam is formed so as to be a longitudinal wave in solid samples. Voids equal to or larger than 0.2 mm in diameter in the solder are accurately detected and their sizing data agree within 0.1 mm with those measured visually through an optical microscope after destruction. The imaging performance was examined for fatigue cracks in soldered joints. In 1000 heat cycles between -55 and +150 degrees C, cracks resulted in the soldered joints of most samples, and their growth was clearly visible. By comparing the images with those observed by a scanning electron microscope, minimum cracks of 1-mum separation were found to be detectable. The c-scan imaging of a 14x14 mm area of the joints was completed in 1.2 s by the system.

    Imaging flaws in soldered joints of integrated circuits using an ultrasound electronic scanning technique. Publishing Authors By Initials

    j kubotaJ Kubota,y mushaY Musha,m takahashiM Takahashi,

    For similar abstracts research abstracts see: abstracts research

    PUBMED ID PMID:

    MEDLINE DATE:

    Imaging flaws in soldered joints of integrated circuits using an ultrasound electronic scanning technique. Journal Published:

    PUBLICATION TYPE: Journal Article

    Journal: IEEE transactions on ultrasonics, ferroelectrics,

    VOLUME: 39

    Page Numbers: 122-6

    Journal Abbreviation:

    ISSN: 0885-3010

    DAY: 11

    MONTH: 02

    YEAR: 1992

    Imaging flaws in soldered joints of integrated circuits using an ultrasound electronic scanning technique. Information

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    LANGUAGE: eng

    NlmUniqueID: 9882735

    Imaging flaws in soldered joints of integrated circuits using an ultrasound electronic scanning technique. Keywords Mesh Terms:

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    Grant and Affiliation Information for Imaging flaws in soldered joints of integrated circuits using an ultrasound electronic scanning technique.

    AFFILIATION: Hitachi Ltd.

    Country: United States

    United States Research PublicationUnited States Research Publication

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    MEDLINETA: IEEE Trans Ultrason Ferroelect

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