Feed-forward compensation of surface potential in atomic force microscopy.

Feed-forward compensation of surface potential in atomic force microscopy. Research Abstract Details 

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Feed-forward compensation of surface potential in atomic force microscopy. Abstract Text:

We introduce a feed-forward technique for lift-mode Kelvin probe force microscopy to minimize electrostatically induced errors in topography scans. Such errors typically occur when a grounded tip is scanned over a heterogeneous sample with differences in local work function or areas of local surface charging. To minimize electrostatic forces during the topography scan we bias the tip with the surface potential recorded in the previous Kelvin probe scan line. With this method we achieve an error free topography on samples with large variations in local surface potential. Compared to conventional tapping mode, we further observe a significant reduction of tip-induced surface charge modifications on charge patterns written in electret films.

Feed-forward compensation of surface potential in atomic force microscopy. Publishing Authors By Initials

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Feed-forward compensation of surface potential in atomic force microscopy. Journal Published:

PUBLICATION TYPE: Journal Article

Journal: The Review of scientific instruments

VOLUME: 79

Page Numbers: 063704

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ISSN: 0034-6748

DAY: 8

MONTH: Jun

YEAR: 2008

Feed-forward compensation of surface potential in atomic force microscopy. Information

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LANGUAGE: eng

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Grant and Affiliation Information for Feed-forward compensation of surface potential in atomic force microscopy.

AFFILIATION: Nanotechnology Group, Department of Mechanical and Process Engineering, ETH Zurich, Tannenstrasse 3, 8092 Zurich, Switzerland.

Country: United States

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MEDLINETA: Rev Sci Instrum

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