Direct imaging of single-walled carbon nanotubes (SWNTs) suspended on pillar-patterned Si or SiO2 substrates is investigated using transmission electron microscopy (TEM) and scanning electron microscopy (SEM). The suspended nanotubes are successfully observed by direct TEM imaging and it is seen that they have either individual or bundles of SWNTs. Low energy (< or =2 keV) SEM produces high contrast images of suspended SWNTs. On the contrary, when SWNTs contact a SiO2 substrate, they are imaged using electron-beam induced current. The image brightness depends on the length of SWNTs.
Electron-microscopic imaging of single-walled carbon nanotubes grown on silicon and silicon oxide substrates. Publishing Authors By Initials
Electron-microscopic imaging of single-walled carbon nanotubes grown on silicon and silicon oxide substrates. Journal Published:
PUBLICATION TYPE: Journal Article
Journal: Journal of electron microscopy
VOLUME: 54 Suppl 1
Page Numbers: i3-7
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ISSN: 1477-9986
DAY: 13
MONTH: 09
YEAR: 2005
Electron-microscopic imaging of single-walled carbon nanotubes grown on silicon and silicon oxide substrates. Information
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LANGUAGE: eng
NlmUniqueID: 7611157
Electron-microscopic imaging of single-walled carbon nanotubes grown on silicon and silicon oxide substrates. Keywords Mesh Terms:
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Chemical & Substance for Abstract: Electron-microscopic imaging of single-walled carbon nanotubes grown on silicon and silicon oxide substrates. Information
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Grant and Affiliation Information for Electron-microscopic imaging of single-walled carbon nanotubes grown on silicon and silicon oxide substrates.
AFFILIATION: NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation, Atsugi-shi, Kanagawa 243-0198, Japan. homma@rs.kagu.tus.ac.jp
Country: Japan
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MEDLINETA: J Electron Microsc (Tokyo)
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