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Electron-microscopic imaging of single-walled carbon nanotubes grown on silicon and silicon oxide substrates.

Electron-microscopic imaging of single-walled carbon nanotubes grown on silicon and silicon oxide substrates. Research Abstract Details 

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  • Electron-microscopic imaging of single-walled carbon nanotubes grown on silicon and silicon oxide substrates. Abstract Text:

    yoshikazu hommaYoshikazu Homma,daisuke takagiDaisuke Takagi,satoru suzukiSatoru Suzuki,ken-ich kanzakiKen-Ich Kanzaki,yoshihiro kobayashiYoshihiro Kobayashi,yoshikazu hommaYoshikazu Homma,daisuke takagiDaisuke Takagi,satoru suzukiSatoru Suzuki,ken-ich kanzakiKen-ich Kanzaki,yoshihiro kobayashiYoshihiro Kobayashi,

    Direct imaging of single-walled carbon nanotubes (SWNTs) suspended on pillar-patterned Si or SiO2 substrates is investigated using transmission electron microscopy (TEM) and scanning electron microscopy (SEM). The suspended nanotubes are successfully observed by direct TEM imaging and it is seen that they have either individual or bundles of SWNTs. Low energy (< or =2 keV) SEM produces high contrast images of suspended SWNTs. On the contrary, when SWNTs contact a SiO2 substrate, they are imaged using electron-beam induced current. The image brightness depends on the length of SWNTs.

    Electron-microscopic imaging of single-walled carbon nanotubes grown on silicon and silicon oxide substrates. Publishing Authors By Initials

    y hommaY Homma,d takagiD Takagi,s suzukiS Suzuki,ki kanzakiKI Kanzaki,y kobayashiY Kobayashi,y hommaY Homma,d takagiD Takagi,s suzukiS Suzuki,ki kanzakiKI Kanzaki,y kobayashiY Kobayashi,

    For similar abstracts research abstracts see: abstracts research

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    Electron-microscopic imaging of single-walled carbon nanotubes grown on silicon and silicon oxide substrates. Journal Published:

    PUBLICATION TYPE: Journal Article

    Journal: Journal of electron microscopy

    VOLUME: 54 Suppl 1

    Page Numbers: i3-7

    Journal Abbreviation:

    ISSN: 1477-9986

    DAY: 13

    MONTH: 09

    YEAR: 2005

    Electron-microscopic imaging of single-walled carbon nanotubes grown on silicon and silicon oxide substrates. Information

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    LANGUAGE: eng

    NlmUniqueID: 7611157

    Electron-microscopic imaging of single-walled carbon nanotubes grown on silicon and silicon oxide substrates. Keywords Mesh Terms:

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    Grant and Affiliation Information for Electron-microscopic imaging of single-walled carbon nanotubes grown on silicon and silicon oxide substrates.

    AFFILIATION: NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation, Atsugi-shi, Kanagawa 243-0198, Japan. homma@rs.kagu.tus.ac.jp

    Country: Japan

    Japan Research PublicationJapan Research Publication

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    MEDLINETA: J Electron Microsc (Tokyo)

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