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Electron cyclotron resonance charge breeder ion source simulation by MCBC and GEM.

Electron cyclotron resonance charge breeder ion source simulation by MCBC and GEM. Research Abstract Details 

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  • Electron cyclotron resonance charge breeder ion source simulation by MCBC and GEM. Abstract Text:

    j s kimJ S Kim,l zhaoL Zhao,b p cluggishB P Cluggish,i n bogatuI N Bogatu,r pardoR Pardo,

    Numerical simulation results by the GEM and MCBC codes are presented, along with a comparison with experiments for beam capture dynamics and parameter studies of charge state distribution (CSD) of electron cyclotron resonance charge breeder ion sources. First, steady state plasma profiles are presented by GEM with respect to key experimental parameters such as rf power and gas pressure. As rf power increases, electron density increases by a small amount and electron energy by a large amount. The central electrostatic potential dip also increased. Next, MCBC is used to trace injected beam ions to obtain beam capture profiles. Using the captured ion profiles, GEM obtains a CSD of beam ions. As backscattering can be significant, capturing the ions near the center of the device enhances the CSD. The effect of rf power on the beam CSD is mainly due to different steady states plasmas. Example cases are presented assuming that the beam ions are small enough not to affect the plasma.

    Electron cyclotron resonance charge breeder ion source simulation by MCBC and GEM. Publishing Authors By Initials

    js kimJS Kim,l zhaoL Zhao,bp cluggishBP Cluggish,in bogatuIN Bogatu,r pardoR Pardo,

    For similar abstracts research abstracts see: abstracts research

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    Electron cyclotron resonance charge breeder ion source simulation by MCBC and GEM. Journal Published:

    PUBLICATION TYPE: Journal Article

    Journal: The Review of scientific instruments

    VOLUME: 79

    Page Numbers: 02B906

    Journal Abbreviation:

    ISSN: 0034-6748

    DAY: 4

    MONTH: Feb

    YEAR: 2008

    Electron cyclotron resonance charge breeder ion source simulation by MCBC and GEM. Information

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    LANGUAGE: eng

    NlmUniqueID: 405571

    Electron cyclotron resonance charge breeder ion source simulation by MCBC and GEM. Keywords Mesh Terms:

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    Grant and Affiliation Information for Electron cyclotron resonance charge breeder ion source simulation by MCBC and GEM.

    AFFILIATION: FAR-TECH, Inc., 3550 General Atomics Court 15-155, San Diego, California 92121, USA.

    Country: United States

    United States Research PublicationUnited States Research Publication

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    MEDLINETA: Rev Sci Instrum

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