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Dose, exposure time and resolution in serial X-ray crystallography.

Dose, exposure time and resolution in serial X-ray crystallography. Research Abstract Details 

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  • Dose, exposure time and resolution in serial X-ray crystallography. Abstract Text:

    d starodubD Starodub,p rezP Rez,g hembreeG Hembree,m howellsM Howells,d shapiroD Shapiro,h n chapmanH N Chapman,p frommeP Fromme,k schmidtK Schmidt,u weierstallU Weierstall,r b doakR B Doak,j c h spenceJ C H Spence,d starodubD Starodub,p rezP Rez,g hembreeG Hembree,m howellsM Howells,d shapiroD Shapiro,h n chapmanH N Chapman,p frommeP Fromme,k schmidtK Schmidt,u weierstallU Weierstall,r b doakR B Doak,j c h spenceJ C H Spence,

    The resolution of X-ray diffraction microscopy is limited by the maximum dose that can be delivered prior to sample damage. In the proposed serial crystallography method, the damage problem is addressed by distributing the total dose over many identical hydrated macromolecules running continuously in a single-file train across a continuous X-ray beam, and resolution is then limited only by the available molecular and X-ray fluxes and molecular alignment. Orientation of the diffracting molecules is achieved by laser alignment. The incident X-ray fluence (energy/area) is evaluated that is required to obtain a given resolution from (i) an analytical model, giving the count rate at the maximum scattering angle for a model protein, (ii) explicit simulation of diffraction patterns for a GroEL-GroES protein complex, and (iii) the spatial frequency cut-off of the transfer function following iterative solution of the phase problem, and reconstruction of an electron density map in the projection approximation. These calculations include counting shot noise and multiple starts of the phasing algorithm. The results indicate counting time and the number of proteins needed within the beam at any instant for a given resolution and X-ray flux. An inverse fourth-power dependence of exposure time on resolution is confirmed, with important implications for all coherent X-ray imaging. It is found that multiple single-file protein beams will be needed for sub-nanometer resolution on current third-generation synchrotrons, but not on fourth-generation designs, where reconstruction of secondary protein structure at a resolution of 7 A should be possible with relatively short exposures.

    Dose, exposure time and resolution in serial X-ray crystallography. Publishing Authors By Initials

    d starodubD Starodub,p rezP Rez,g hembreeG Hembree,m howellsM Howells,d shapiroD Shapiro,hn chapmanHN Chapman,p frommeP Fromme,k schmidtK Schmidt,u weierstallU Weierstall,rb doakRB Doak,jc spenceJC Spence,d starodubD Starodub,p rezP Rez,g hembreeG Hembree,m howellsM Howells,d shapiroD Shapiro,hn chapmanHN Chapman,p frommeP Fromme,k schmidtK Schmidt,u weierstallU Weierstall,rb doakRB Doak,jc spenceJC Spence,

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    Dose, exposure time and resolution in serial X-ray crystallography. Journal Published:

    PUBLICATION TYPE: Journal Article

    Journal: Journal of synchrotron radiation

    VOLUME: 15

    Page Numbers: 62-73

    Journal Abbreviation:

    ISSN: 0909-0495

    DAY: 18

    MONTH: 12

    YEAR: 2007

    Dose, exposure time and resolution in serial X-ray crystallography. Information

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    LANGUAGE: eng

    NlmUniqueID: 9888878

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    Grant and Affiliation Information for Dose, exposure time and resolution in serial X-ray crystallography.

    AFFILIATION: Department of Physics, Arizona State University, PO Box 871504, Tempe, AZ 85287-1504, USA.

    Country: Denmark

    Denmark Research PublicationDenmark Research Publication

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    MEDLINETA: J Synchrotron Radiat

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