[Determination of composition of electronic material by fundamental parameter method of XRF]

[Determination of composition of electronic material by fundamental parameter method of XRF] Research Abstract Details 

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[Determination of composition of electronic material by fundamental parameter method of XRF] Abstract Text:

S Sui,J Wei,Q Shi,

The fundamental parameters (FP) method of XRF in determination of the composition of electronic ceramic materials is studied. The fundamental parameters needed in calculation are developed by math calculation and the program is developed in C language. The method can also be used in determination of the composition of alloy. Some samples are analysed by this method and the relative derivation is less than 3%.

[Determination of composition of electronic material by fundamental parameter method of XRF] Publishing Authors By Initials

S Sui,J Wei,Q Shi,

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[Determination of composition of electronic material by fundamental parameter method of XRF] Journal Published:

PUBLICATION TYPE: Journal Article

Journal: Guang pu xue yu guang pu fen xi = Guang pu

VOLUME: 17

Page Numbers: 99-104

Journal Abbreviation:

ISSN: 1000-0593

DAY: 6

MONTH: Jun

YEAR: 1997

[Determination of composition of electronic material by fundamental parameter method of XRF] Information

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LANGUAGE: chi

NlmUniqueID: 9424805

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Grant and Affiliation Information for [Determination of composition of electronic material by fundamental parameter method of XRF]

AFFILIATION: University of Electronic Science & Technology of China, 610054 Chengdu.

Country: China

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MEDLINETA: Guang Pu Xue Yu Guang Pu Fen X

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