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Construction and evaluation of a wavelet-based focus measure for microscopy imaging.

Construction and evaluation of a wavelet-based focus measure for microscopy imaging. Research Abstract Details 

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  • Construction and evaluation of a wavelet-based focus measure for microscopy imaging. Abstract Text:

    hui xieHui Xie,weibin rongWeibin Rong,lining sunLining Sun,hui xieHui Xie,weibin rongWeibin Rong,lining sunLining Sun,

    Microscopy imaging can not achieve both high resolution and wide image space simultaneously. Autofocusing is of fundamental importance to automated micromanipulation. This article proposes a new wavelet-based focus measure, which is defined as a ratio of high frequency coefficients and low frequency coefficients. 8 series of 49 microscope images each acquired under five magnifications are used to comprehensively compare the performance of our focus measure with the classic and popular focus measures, including Normalized Variance, Entropy, Energy Laplace and wavelet-based high frequency focus measures. The robustness of these focus measures is evaluated using noisy image sequences corrupted by Gaussian white noise with standard deviations (STD) 5 and 15. An evaluation methodology is proposed, based on which these 5 focus measures are ranked. Experimental results show that the proposed focus measure can provide significantly the best overall performance and robustness. This focus measure can be widely applied to the automated biological and biomedical applications.

    Construction and evaluation of a wavelet-based focus measure for microscopy imaging. Publishing Authors By Initials

    h xieH Xie,w rongW Rong,l sunL Sun,h xieH Xie,w rongW Rong,l sunL Sun,

    For similar abstracts research abstracts see: abstracts research

    PUBMED ID PMID:

    MEDLINE DATE:

    Construction and evaluation of a wavelet-based focus measure for microscopy imaging. Journal Published:

    PUBLICATION TYPE: Research Support, Non-U.S. Gov

    Journal: Microscopy research and technique

    VOLUME: 70

    Page Numbers: 987-95

    Journal Abbreviation: Microsc. Res. Tech.

    ISSN: 1059-910X

    DAY: 29

    MONTH: Nov

    YEAR: 2007

    Construction and evaluation of a wavelet-based focus measure for microscopy imaging. Information

    Number of References:

    LANGUAGE: eng

    NlmUniqueID: 9203012

    Construction and evaluation of a wavelet-based focus measure for microscopy imaging. Keywords Mesh Terms:

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    Grant and Affiliation Information for Construction and evaluation of a wavelet-based focus measure for microscopy imaging.

    AFFILIATION: Robotic Institute, Harbin Institute of Technology, Harbin 150001, Heilongjiang, People's Republic of China. xiehui@hit.edu.cn

    Country: United States

    United States Research PublicationUnited States Research Publication

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    MEDLINETA: Microsc Res Tech

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