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Carrier mobility for organic semiconductors: reduction of noise of the short part drift time in the time of flight mobility method.

Carrier mobility for organic semiconductors: reduction of noise of the short part drift time in the time of flight mobility method. Research Abstract Details 

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  • Carrier mobility for organic semiconductors: reduction of noise of the short part drift time in the time of flight mobility method. Abstract Text:

    ken kashimaKen Kashima,hiroshi satoHiroshi Sato,kiyoshi mushaKiyoshi Musha,ken-ichiro kannoKen-Ichiro Kanno,tamotsu takahashiTamotsu Takahashi,ken kashimaKen Kashima,hiroshi satoHiroshi Sato,kiyoshi mushaKiyoshi Musha,ken-ichiro kannoKen-Ichiro Kanno,tamotsu takahashiTamotsu Takahashi,ken kashimaKen Kashima,hiroshi satoHiroshi Sato,kiyoshi mushaKiyoshi Musha,ken-ichiro kannoKen-Ichiro Kanno,tamotsu takahashiTamotsu Takahashi,

    Measurements of time of flight (TOF) mobility of organic semiconductors become difficult when the mobility values are high, since the electronic signals overlap with the noise of the short part in drift time. Such noise of the short part in the drift time in the TOF method for measurements of carrier mobility was reduced by three methods: (1) longer distance (3.5 m) between sample and the N(2) laser, (2) optical connection (photo coupler) between the N(2) laser and the pulse generator, and (3) using a digital filter to remove characteristic pulses caused by N(2) laser. Each method showed significant reduction of the noise. When all three methods were applied, 94% of the noise was reduced. The measurement of TOF mobility was demonstrated with TPD (N,N'-diphenyl-N,N'-di(meta-tolyl)benzidine) film. Electronic signals in TOF measurements were clearly observed and the TOF mobility was determined to be 9.0 x 10(-4) cm(2)/V s.

    Carrier mobility for organic semiconductors: reduction of noise of the short part drift time in the time of flight mobility method. Publishing Authors By Initials

    k kashimaK Kashima,h satoH Sato,k mushaK Musha,k kannoK Kanno,t takahashiT Takahashi,k kashimaK Kashima,h satoH Sato,k mushaK Musha,k kannoK Kanno,t takahashiT Takahashi,k kashimaK Kashima,h satoH Sato,k mushaK Musha,k kannoK Kanno,t takahashiT Takahashi,

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    Carrier mobility for organic semiconductors: reduction of noise of the short part drift time in the time of flight mobility method. Journal Published:

    PUBLICATION TYPE: Journal Article

    Journal: Analytical sciences : the international journal of

    VOLUME: 23

    Page Numbers: 1249-51

    Journal Abbreviation:

    ISSN: 0910-6340

    DAY: 11

    MONTH: Oct

    YEAR: 2007

    Carrier mobility for organic semiconductors: reduction of noise of the short part drift time in the time of flight mobility method. Information

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    LANGUAGE: eng

    NlmUniqueID: 8511078

    Carrier mobility for organic semiconductors: reduction of noise of the short part drift time in the time of flight mobility method. Keywords Mesh Terms:

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    Grant and Affiliation Information for Carrier mobility for organic semiconductors: reduction of noise of the short part drift time in the time of flight mobility method.

    AFFILIATION: Catalysis Research Center and Graduate School of Life Science, Hokkaido University, Sapporo 001-0021, Japan.

    Country: Japan

    Japan Research PublicationJapan Research Publication

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    MEDLINETA: Anal Sci

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