A three-orthogonal-Hall-probe assembly with an 'on the fly' mapping method has been developed to characterize an elliptically polarizing undulator (EPU). The underlying design concept is that it can measure the three real field components without any field correction under a reliable and synchronization measurement method. Therefore, the relative central position shift, orthogonal angle and the planar Hall effect error between the three Hall probes should be calibrated and readjusted. Experimental results demonstrate that this method can yield an r.m.s. reproducibility of 10 G cm for the three field components and 2 G for the peak field strength. Under precision conditions this system can completely measure the three on-axis field components within 2 min for a 4 m-long EPU.
Advanced field-measurement method with three orthogonal Hall probes for an elliptically polarizing undulator. Publishing Authors By Initials
Advanced field-measurement method with three orthogonal Hall probes for an elliptically polarizing undulator. Journal Published:
PUBLICATION TYPE: Journal Article
Journal: Journal of synchrotron radiation
VOLUME: 5
Page Numbers: 471-4
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ISSN: 0909-0495
DAY: 1
MONTH: 05
YEAR: 1998
Advanced field-measurement method with three orthogonal Hall probes for an elliptically polarizing undulator. Information
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LANGUAGE: eng
NlmUniqueID: 9888878
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Grant and Affiliation Information for Advanced field-measurement method with three orthogonal Hall probes for an elliptically polarizing undulator.
AFFILIATION: Synchrotron Radiation Research Centre, Hsinchu Science-Based Industrial Park, Hsinchu, Taiwan.
Country: Denmark
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MEDLINETA: J Synchrotron Radiat
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